Wiesbaden, Germany

Eric J Riehn

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Smiths Detection Germany Gmbh. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eric J Riehn. Retrieved from https://idiyas.com/inventor/eric-j-riehn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Eric J Riehn: Innovator in Dual Energy Detection Technology

Introduction

Eric J Riehn is a notable inventor based in Wiesbaden, Germany. He has made significant contributions to the field of X-ray detection technology. His innovative work focuses on enhancing the capabilities of dual-energy X-ray detectors.

Latest Patents

Eric J Riehn holds a patent for a "Dual energy detector and methods for processing detector data." This invention discloses a dual-energy X-ray detector that features a first detector line with first detector elements and a second detector line with second detector elements arranged parallel to one another. The design allows for effective offset in the projection of the detector lines, improving the accuracy of X-ray beam detection. This technology is crucial for various applications, including X-ray inspection apparatuses.

Career Highlights

Eric J Riehn is currently associated with Smiths Detection Germany GmbH, where he continues to develop advanced detection technologies. His work at the company emphasizes the importance of innovation in safety and security solutions.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Eric J Riehn's contributions to dual-energy detection technology exemplify the impact of innovative thinking in the field of X-ray detection. His patent and ongoing work at Smiths Detection Germany GmbH highlight the importance of advancements in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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