The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2025
Filed:
Jul. 01, 2021
Smiths Detection Germany Gmbh, Wiesbaden, DE;
Eric J. Riehn, Wiesbaden, DE;
Smiths Detection Germany GmbH, Wiesbaden, DE;
Abstract
Disclosed is a dual-energy X-ray detector having a first detector line with first detector elements and a second detector line with second detector elements arranged parallel thereto, the detector lines being arranged parallel to one another in the line direction and being arranged one behind the other in the direction of the X-ray beams to be detected in such a manner that the projection of the first and the second detector lines in the direction of one of the X-ray beams to be detected, which passes through the surface center of gravity of a reference detector element of the first or the second detector line, are overlappingly offset from each other by an effective offset (Δx; Δy). Further disclosed is an X-ray inspection apparatus including such a detector and methods for processing detector data provided by means of the detector.