This inventor holds 2 USPTO granted patents. Top assignees: Leland Stanford Junior University, Ford Global Technolgoies, LLC. Active years: 2024-2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2024-2025
Title: Eric Felix Darve: Innovator in Anomaly Detection Technologies
Introduction
Eric Felix Darve is a notable inventor based in Foster City, CA (US). He has made significant contributions to the field of anomaly detection, holding 2 patents that showcase his innovative approaches to identifying anomalies in multi-modal data streams.
Latest Patents
One of his latest patents is titled "Systems and methods for anomaly detection in multi-modal data streams." This invention illustrates a method that includes receiving data streams from multiple sensors, identifying anomalies using distinct models, and determining joint anomalies based on a defined threshold. Another significant patent is the "Anomaly augmented generative adversarial network." This invention focuses on training systems to detect anomalous samples by distinguishing between true data samples and reconstructed samples, enhancing the accuracy of anomaly detection.
Career Highlights
Eric has worked with prestigious organizations such as Leland Stanford Junior University and Ford Global Technologies, LLC. His experience in these institutions has allowed him to refine his skills and contribute to groundbreaking research in anomaly detection technologies.
Collaborations
Throughout his career, Eric has collaborated with talented individuals, including Ziyi Yang and Iman Soltani Bozchalooi. These collaborations have further enriched his work and expanded the impact of his inventions.
Conclusion
Eric Felix Darve is a prominent figure in the realm of anomaly detection, with a focus on innovative systems and methods that enhance data analysis. His contributions continue to influence the field and pave the way for future advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile