The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Jun. 20, 2023
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

Daniel Ratner, San Francisco, CA (US);

Eric Felix Darve, Foster City, CA (US);

Ryan Humble, San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/00 (2013.01);
Abstract

Systems and method for detecting anomalies in accordance with embodiments of the invention are illustrated. One embodiment includes receiving a first data stream collected from a first sensor, identifying a first set of anomalies in the first data stream using a first model, receiving a second data stream collected from a second sensor, identifying a second set of anomalies in the second data stream using a second model, determining a set of joint anomalies using the first set of anomalies, second set of anomalies, and a threshold, wherein a threshold is some time period, and updating how anomalies are identified in the first and second set of models using the set of joint anomalies.


Find Patent Forward Citations

Loading…