Company Filing History:
Years Active: 2010-2017
Title: Eric Endres: Innovator in Probe Card Technology
Introduction
Eric Endres is a notable inventor based in Issaquah, WA (US). He has made significant contributions to the field of probe card technology, holding a total of 3 patents. His work focuses on enhancing the efficiency and effectiveness of wafer test probe cards.
Latest Patents
One of Eric's latest patents is a "Probe card analysis system and method." This innovative system evaluates wafer test probe cards under real-world wafer test cell conditions. It integrates wafer test cell components into the probe card inspection and analysis process. The disclosed embodiments may utilize existing and/or modified wafer test cell components such as a head plate, a test head, a signal delivery system, and a manipulator to emulate wafer test cell dynamics during the probe card inspection and analysis process.
Career Highlights
Eric Endres is currently employed at Rudolph Technologies, Inc., where he continues to develop cutting-edge technologies in the semiconductor industry. His expertise in probe card analysis has positioned him as a key player in advancing testing methodologies.
Collaborations
Throughout his career, Eric has collaborated with talented individuals such as John Timothy Strom and Christian Kuwasaki. These partnerships have fostered innovation and contributed to the success of various projects.
Conclusion
Eric Endres is a distinguished inventor whose work in probe card technology has made a significant impact in the semiconductor industry. His innovative patents and collaborations highlight his commitment to advancing technology in this field.