Erez Arbel-Meirovich

This inventor holds 4 USPTO granted patents. Top assignees: Freescale Semiconductor,inc., Nxp USA, Inc.. Active years: 2012-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Erez Arbel-Meirovich. Retrieved from https://idiyas.com/inventor/erez-arbel-meirovich

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4

% Patents Active = 25.0

Average Co-Inventor Count = 3.7

ph-index = 1

Forward Citations = 2(Granted Patents)

Company Filing History:

3 out of 5,491

Freescale Semiconductor,inc.

Years Active: 2012-2018

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4 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9934035 - Device and method for tracing updated predicate values (2018-04-03),

2. 8452553 - Device and method for testing a circuit (2013-05-28),

3. 8341301 - Device and method for testing a direct memory access controller (2012-12-25),

4. 8239587 - Device having data sharing capabilities and a method for sharing data (2012-08-07),

Title: Inventor Erez Arbel-Meirovich

Introduction: Erez Arbel-Meirovich is a renowned inventor hailing from Yahud, Israel, known for his groundbreaking contributions to various technological fields.

Latest Patents: Erez Arbel-Meirovich holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise.

Career Highlights: Throughout his career, Erez Arbel-Meirovich has worked with top research institutions and leading companies to develop innovative solutions that have had a significant impact on society.

Collaborations: Erez Arbel-Meirovich has collaborated with fellow inventors, engineers, and scientists from around the world, fostering a culture of creativity and excellence in his projects.

Conclusion: Erez Arbel-Meirovich's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and entrepreneurs.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]