Petach-Tikva, Israel

Eran Tal

This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials South East Asia Pte. Ltd.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eran Tal. Retrieved from https://idiyas.com/inventor/eran-tal-3u6we40r

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Eran Tal - Innovator in Optical Inspection Systems

Introduction

Eran Tal is a notable inventor based in Petah-Tikva, Israel. He has made significant contributions to the field of optical inspection systems, particularly in the area of image splitting technology. His innovative approach has the potential to enhance the efficiency and accuracy of optical inspection tools used in various industries.

Latest Patents

Eran Tal holds a patent for his invention titled "Image splitting in optical inspection systems." This patent describes a method in which an image of an object under inspection, such as a semiconductor wafer, is obtained using imaging optics that define a focal plane. The light comprising the image can be split into portions that are detected using multiple detectors, each registering a portion of the image. The technology allows for the image at the focal plane to be divided into two, three, or more parts using polarization-based beam splitters and/or lenses positioned tangent to the focal plane. The splitting apparatus may include a pair of arrays of half-cylinder lenses, which can effectively divide incoming light into rectangular portions without introducing non-uniformities.

Career Highlights

Eran Tal is currently employed at Applied Materials South East Asia Pte. Ltd., where he continues to develop and refine his innovative technologies. His work focuses on improving optical inspection systems, which are critical in the manufacturing and quality control processes of semiconductor devices.

Collaborations

Eran collaborates with talented professionals in his field, including Shai Silberstein and Ori Gonen. These collaborations enhance the development of cutting-edge technologies and foster innovation within the industry.

Conclusion

Eran Tal's contributions to optical inspection systems exemplify the importance of innovation in technology. His patent for image splitting technology showcases his commitment to advancing the field and improving inspection processes. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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