Toyama, Japan

Emi Kanasaki

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2006.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Emi Kanasaki: Innovator in Semiconductor Technology

Introduction

Emi Kanasaki is a prominent inventor based in Toyama, Japan. She has made significant contributions to the field of semiconductor technology. Her innovative work has led to the development of a unique method for measuring temperature during the fabrication of semiconductor devices.

Latest Patents

Emi Kanasaki holds 1 patent for her invention titled "Method for measuring temperature, annealing method and method for fabricating semiconductor device." This patent describes a process where the emissivity on the reverse face of a substrate is measured during the annealing process. The method is particularly useful for substrates with films made from materials that vary the emissivity, such as those used in forming plug and capacitor electrodes.

Career Highlights

Kanasaki is currently employed at Matsushita Electric Industrial Co., Ltd., where she continues to advance her research and development efforts. Her work has been instrumental in enhancing the efficiency and effectiveness of semiconductor manufacturing processes.

Collaborations

Emi has collaborated with notable colleagues, including Satoshi Shibata and Yasushi Naito. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Emi Kanasaki is a trailblazer in the semiconductor industry, with her patented methods paving the way for advancements in technology. Her contributions are vital to the ongoing evolution of semiconductor fabrication techniques.

Profile summary based on public USPTO records.
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