Boise, ID, United States of America

Emanuele Confalonieri

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Micron Technology Incorporated. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Emanuele Confalonieri. Retrieved from https://idiyas.com/inventor/emanuele-confalonieri-6l19jdub

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Emanuele Confalonieri: Innovator in Memory Device Technology

Introduction

Emanuele Confalonieri is a notable inventor based in Boise, ID (US). She has made significant contributions to the field of memory device technology, particularly in enhancing reliability, accessibility, and serviceability.

Latest Patents

Emanuele holds a patent for a "Parity cache for RAID reliability, accessibility, and serviceability of a memory device." This innovative patent outlines methods and systems designed to improve the RAS features of memory devices. The system includes a memory and a memory side cache, along with a processor that minimizes accesses to the memory by executing specific operations. These operations involve computing new parity based on old data, new data, and old parity in response to data from the memory side cache being written to the memory.

Career Highlights

Emanuele is currently employed at Micron Technology Incorporated, where she continues to develop cutting-edge technologies in the memory sector. Her work focuses on improving the efficiency and reliability of memory devices, which are crucial for various applications in computing.

Collaborations

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Conclusion

Emanuele Confalonieri's contributions to memory device technology exemplify her innovative spirit and dedication to advancing the field. Her patent reflects her commitment to enhancing the performance and reliability of memory systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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