Hartland, WI, United States of America

Emanuel V Polizzi

This inventor holds 2 USPTO granted patents. Top assignee: General Electric Company. Active years: 1982-1986.


% Patents Active = 100.0

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 85(Granted Patents)


Location History:

  • Hartland, WI (US) (1982)
  • Waukesha, WI (US) (1986)

Company Filing History:


Years Active: 1982-1986

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2 patents (USPTO):Explore Patents

Title: Innovations by Emanuel V Polizzi

Introduction

Emanuel V Polizzi is a notable inventor based in Hartland, WI (US). He has made significant contributions to the field of X-ray technology, holding a total of 2 patents. His work focuses on improving the alignment and accuracy of X-ray systems, which is crucial for medical imaging.

Latest Patents

Polizzi's latest patents include a "Device for aligning cooperating X-ray systems" and an "X-Ray apparatus alignment method and device." The first patent describes a system that ensures the isocenters of two independent X-ray systems are aligned using a target frame with crosshairs. This innovative approach allows for precise adjustments to be made, ensuring accurate imaging. The second patent introduces a central ray locator that enhances the alignment of X-ray beams with image receptors, utilizing a laser device for improved visual indication.

Career Highlights

Emanuel V Polizzi has had a distinguished career, working with General Electric Company, where he has applied his expertise in X-ray technology. His inventions have contributed to advancements in medical imaging, enhancing the capabilities of X-ray systems.

Collaborations

Polizzi has collaborated with notable coworkers such as Joseph J Grass and Marvin P Glyzewski, contributing to the development of innovative solutions in the field of X-ray technology.

Conclusion

Emanuel V Polizzi's contributions to X-ray technology through his patents demonstrate his commitment to innovation and improvement in medical imaging. His work continues to impact the field positively.

Profile summary based on public USPTO records.
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