This inventor holds 3 USPTO granted patents. Top assignee: Dbm Optics, Inc.. Active years: 2004-2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004-2006
Title: Elwood James Egerton: Innovator in Measuring Instruments
Introduction
Elwood James Egerton is a notable inventor based in Longmont, Colorado. He has made significant contributions to the field of measuring instruments, holding a total of 3 patents. His innovative work focuses on enhancing the speed and dynamic range of measurement technologies.
Latest Patents
One of Egerton's latest patents is titled "Bifurcated range stages to increase speed or dynamic range of measuring instruments and associated methods." This invention involves multiple stage ranging circuitry that selectively amplifies input signals based on their magnitude. The design allows for high-speed measurements over a wide dynamic range, improving the efficiency of measuring instruments.
Another significant patent is "Mitigating the effects of miniaturizing integrating spheres for fiber optic measurement." This invention features a miniature integrating sphere designed with a unique light inlet and outlet configuration. The design optimizes the measurement of light from fiber optic devices, allowing for more accurate optical measurements.
Career Highlights
Egerton is currently associated with Dbm Optics, Inc., where he continues to develop innovative solutions in the field of optics and measurement. His work has been instrumental in advancing technologies that enhance measurement accuracy and speed.
Collaborations
Throughout his career, Egerton has collaborated with talented individuals such as Michael Minneman and Michael Paul Atwell. These collaborations have contributed to the development of cutting-edge technologies in measuring instruments.
Conclusion
Elwood James Egerton's contributions to the field of measuring instruments demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in measurement technology, making him a valuable figure in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile