Loveland, CO, United States of America

Elton C Bingham

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Company. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elton C Bingham. Retrieved from https://idiyas.com/inventor/elton-c-bingham

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: The Innovations of Elton C. Bingham

Introduction

Elton C. Bingham is a notable inventor based in Loveland, Colorado. He has made significant contributions to the field of digital logic testing. His work focuses on enhancing the reliability and safety of circuit testing methods.

Latest Patents

Elton C. Bingham holds a patent for a "High throughput circuit tester and test technique avoiding overdriving." This invention provides a method and apparatus designed to reduce the likelihood of damage to digital logic devices during testing. It aims to locate faults in circuit assemblies while ensuring the safety of the devices involved.

Career Highlights

Bingham is associated with Hewlett-Packard Company, where he has applied his expertise in circuit testing. His innovative approach has contributed to advancements in testing techniques within the industry.

Collaborations

He has worked alongside notable colleagues such as William A. Groves and Vance R. Harwood. Their collaborative efforts have furthered the development of effective testing solutions.

Conclusion

Elton C. Bingham's contributions to circuit testing demonstrate his commitment to innovation and safety in technology. His patent reflects a significant advancement in the field, showcasing his expertise and dedication to improving digital logic testing methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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