The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 1986
Filed:
Jun. 13, 1983
Applicant:
Inventors:
William A Groves, Loveland, CO (US);
Vance R Harwood, Loveland, CO (US);
Thomas R Fay, Fort Collins, CO (US);
Elton C Bingham, Loveland, CO (US);
Michael A Teska, Loveland, CO (US);
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 / ; 364481 ; 371 20 ; 371 25 ;
Abstract
A method and apparatus are disclosed for reducing the likelihood of damage to digital logic devices under test or located in close electrical proximity to the device under test while attempting to locate faults in circuit assemblies using digital incircuit test techniques.
Groves, William. (1986). High throughput circuit tester and test technique avoiding overdriving (U.S. Patent No. 4588945). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4588945
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile