Toronto, Canada

Elin Y Liu

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Christie Digital Systems USA, Inc.. Active years: 2026.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Elin Y Liu - Innovator in Display System Calibration

Introduction

Elin Y Liu is a prominent inventor based in Toronto, Canada. She has made significant contributions to the field of display technology, particularly in the calibration of display systems. Her innovative approach has led to the development of a unique method that enhances the accuracy and performance of display systems.

Latest Patents

Elin Y Liu holds a patent for a method titled "Display System Calibration." This patent describes a process for calibrating a display system by presenting a test pattern that includes a plurality of blobs. A camera captures an image of these blobs, and an exposure calibration parameter is calculated. This parameter is derived from the ratio of the maximum brightness level readable by the camera to the maximum brightness level determined from the captured blobs. The calibration process ensures that the camera's exposure is optimized for the display system.

Career Highlights

Elin is currently employed at Christie Digital Systems USA, Inc., where she continues to work on innovative display technologies. Her expertise in calibration methods has positioned her as a valuable asset to her team and the company.

Collaborations

Elin has collaborated with notable colleagues, including Peter Anthony Van Eerd and Jarrod Griffin Pas. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies in the display industry.

Conclusion

Elin Y Liu's contributions to display system calibration exemplify her innovative spirit and dedication to advancing technology. Her work not only enhances display accuracy but also sets a standard for future developments in the field.

Profile summary based on public USPTO records.
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