The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Nov. 25, 2024
Christie Digital Systems Usa, Inc., Cypress, CA (US);
Elin Y. Liu, Toronto, CA;
Peter Anthony Van Eerd, Guelph, CA;
Nicholai Wasilka, Kitchener, CA;
Jarrod Griffin Pas, Kitchener, CA;
Abstract
A method for calibrating a display system is provided. A test pattern for display is presented. The test pattern includes a plurality of blobs. Using a camera, an image comprising one or more of the plurality of blobs in the presented test pattern is captured. An exposure calibration parameter is calculated using a ratio of a maximum brightness level capable of being read by the camera to a maximum brightness level determined from the captured one or more blobs in the test pattern. The exposure of the camera of the display system is calibrated using the exposure calibration parameter. A display system configured to implement the method is also provided.