San Jose, CA, United States of America

Elias Martinez

This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Elias Martinez. Retrieved from https://idiyas.com/inventor/elias-martinez-dbc6zy6t

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations by Elias Martinez

Introduction

Elias Martinez is an accomplished inventor based in San Jose, California. He has made significant contributions to the field of moisture detection technology. His innovative approach has led to the development of a unique patent that addresses moisture control.

Latest Patents

Elias holds a patent for a "Chamber moisture control using narrow optical filters measuring emission lines." This invention includes a moisture detection module that comprises an optical bandpass filter. The filter is configured to be optically coupled to a light source, with a passband centered at 309 nm. Additionally, the moisture detection module features a detector that is optically coupled to the optical bandpass filter.

Career Highlights

Elias Martinez is currently employed at Applied Materials, Inc., a leading company in the field of materials engineering. His work focuses on developing advanced technologies that enhance manufacturing processes. His expertise and innovative mindset have made him a valuable asset to his team.

Collaborations

Elias collaborates with his coworker, Sven Schramm, to further advance their projects and share insights in their field of expertise.

Conclusion

Elias Martinez exemplifies the spirit of innovation through his patent and contributions to moisture detection technology. His work at Applied Materials, Inc. continues to push the boundaries of what is possible in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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