This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials Israel Limited. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Eli Kaminsky and Semiconductor Defect Examination
Introduction
Eli Kaminsky is an inventor based in Rehovot, Israel. His patent work addresses the use of machine learning to examine semiconductor specimens for defects.
Latest Patents
Kaminsky is associated with 1 patent, titled “Fourier Transform Based Machine Learning for Defect Examination of Semiconductor Specimens.” The invention describes a method that obtains an input image showing differences between an inspection image and a corresponding reference image. A trained machine-learning system then processes that image to produce a defect map indicating candidate defects of interest. The system uses multiple machine-learning models trained together to detect defects based on Fourier transforms, and its output can support further examination.
Career Highlights
Kaminsky works at Applied Materials Israel Limited. His patent reflects an application of machine learning and Fourier-transform analysis to semiconductor inspection.
Collaborations
Kaminsky’s listed coworker is Yulia Krasilshchikov.
Conclusion
Eli Kaminsky’s patent work focuses on machine-learning methods for identifying and mapping potential defects in semiconductor specimens.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile