Chicago, IL, United States of America

Ejaj Ahmed


Average Co-Inventor Count = 7.0

ph-index = 2

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2007-2010

where 'Filed Patents' based on already Granted Patents

2 patents (USPTO):

Title: Ejaj Ahmed: Innovator in Metrology Tool Development

Introduction

Ejaj Ahmed is a notable inventor based in Chicago, IL (US). He has made significant contributions to the field of metrology, particularly in the development of tools and methods for measuring microelectronic features. With a total of 2 patents, his work is recognized for its innovative approach to enhancing measurement accuracy and efficiency.

Latest Patents

Ejaj Ahmed's latest patents include a method for preparing recipes for operating a metrology tool. This method involves creating a desired recipe that includes instructions for measuring one or more dimensions in a microelectronic feature. The process entails comparing the desired recipe with a database of known instructions, identifying differences, and modifying the recipe accordingly. This ensures that the metrology tool operates with the most accurate and effective instructions available. His patents also emphasize the importance of verifying the recipe before execution, thereby enhancing the reliability of microelectronic feature measurements.

Career Highlights

Ejaj Ahmed is currently employed at International Business Machines Corporation (IBM), where he continues to innovate in the field of metrology. His work has been instrumental in advancing the technology used for precise measurements in microelectronics. His contributions have not only improved operational efficiency but have also set new standards in the industry.

Collaborations

Ejaj has collaborated with notable colleagues such as Charles Neill Archie and Stephen W Goodrich. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and expertise, further enhancing the quality of their innovations.

Conclusion

Ejaj Ahmed stands out as a key figure in the realm of metrology tool development. His innovative patents and contributions to IBM reflect his commitment to advancing measurement technologies. His work continues to influence the industry and pave the way for future innovations in microelectronics.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…