Eileen Pimentel is a notable inventor based in Dayton, OH (US). She has made significant contributions to the field of semiconductor measurement technologies. With a total of 2 patents, her work focuses on innovative methods and apparatuses that enhance the understanding of semiconductor characteristics.

Latest Patents

Eileen's latest patents include a "Method and apparatus for measuring average resistivity and hall-effect." This invention features an apparatus designed to measure the average characteristics of a semiconductor wafer. The apparatus consists of four electrical contacts that are removably connected to the wafer at equidistant positions on its periphery. Additionally, a flat permanent magnet is positioned adjacent to the wafer to apply a uniform magnetic field to one surface. The control apparatus connected to the electrical contacts applies current successively and measures the voltage across opposing sets of contacts, allowing for the determination of average dark resistivity, carrier mobility, and carrier concentration. Furthermore, the apparatus can be adapted to measure the average light characteristics of a photoconductive semiconductor wafer.

Another significant patent is the "Method and apparatus for measuring photoresistivity and photo." This invention also focuses on measuring the characteristics of a photoconductive semiconductor wafer. It includes a light source that directs light of uniform intensity toward the wafer's surface. The apparatus features masking equipment that transmits light in a cross shape, allowing for precise measurements of resistivity, carrier mobility, and carrier concentration in illuminated portions of the wafer.

Career Highlights

Eileen Pimentel is affiliated with Wright State University, where she continues her research and development in semiconductor technologies. Her work has garnered attention for its innovative approach to measuring semiconductor properties, which is crucial for advancements in electronics and materials science.

Collaborations

Eileen collaborates with David C Look, a fellow researcher, to further enhance the impact of their work in the field of semiconductor measurement.

Conclusion

Eileen Pimentel's contributions to semiconductor measurement technologies through her patents and research at Wright State University highlight her role as an influential inventor. Her innovative methods are paving the way for advancements in the understanding and application of semiconductor materials.

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