Hitachinaka, Japan

Eiji Imai

USPTO Granted Patents = 9 

Average Co-Inventor Count = 4.0

ph-index = 3

Forward Citations = 16(Granted Patents)


Location History:

  • Hitachinaka, JP (2010 - 2013)
  • Tokyo, JP (2019)

Company Filing History:


Years Active: 2010-2019

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9 patents (USPTO):

Title: Eiji Imai - Innovator in Optical Inspection Technology

Introduction

Eiji Imai, based in Hitachinaka, Japan, is a notable inventor specializing in the field of optical inspection technology. With a total of 9 patents to his name, Imai has made significant contributions to the development of advanced inspection apparatuses and methods, enabling more efficient detection of defects in various materials.

Latest Patents

Among his latest inventions, Imai has developed an inspection apparatus that integrates several sophisticated components. This apparatus features a light irradiation unit that illuminates samples placed on a table. It utilizes a detection optical system to form and detect scattered light images, which are then processed by a dedicated processing unit to identify defects.

Another noteworthy patent is an inspection apparatus designed specifically for wafers. This system includes a wafer stage, an illumination module, and a detection module that outputs image signals based on scattering or reflection rays. It is equipped with a coordinates control module that manages the arrangement of inspection areas and an imperfect area recognition module that identifies flawed inspection areas near the wafer edges.

Career Highlights

Imai is currently affiliated with Hitachi High-Technologies Corporation, where he continues to innovate and advance inspection technologies. His work is pivotal in enhancing quality control processes across various industries, particularly in semiconductor manufacturing.

Collaborations

Throughout his career, Eiji Imai has collaborated with talented professionals such as Hiroyuki Yamashita and Yukihisa Mohara. These collaborations have enriched his work, allowing for the fusion of ideas and expertise in the development of cutting-edge inspection technologies.

Conclusion

Eiji Imai's contributions to the field of optical inspection technology are marked by his innovative spirit and dedication to enhancing quality assurance processes. His patented inventions not only demonstrate his expertise but also signify a substantial impact on the industry, paving the way for future advancements in defect detection methods.

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