Itami, Japan

Eiiehi Ide

This inventor holds 1 USPTO granted patent. Top assignee: Minolta Company, Ltd.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eiiehi Ide. Retrieved from https://idiyas.com/inventor/eiiehi-ide

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Eiiehi Ide: Innovator in Three-Dimensional Measurement Technology

Introduction

Eiiehi Ide is a notable inventor based in Itami, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative three-dimensional measurement apparatus. His work has implications for various industries that require precise measurements of objects.

Latest Patents

Eiiehi Ide holds a patent for a three-dimensional measurement apparatus. This apparatus includes an optical system designed to scan a reference beam across a target object to be measured. It features a light sensor that receives light reflected from the target object, along with a processor that calculates the three-dimensional shape of the object from the received light. Notably, both an image for calculating the three-dimensional shape and an image for displaying the target object are captured by the same sensor. The displayed image is a grayscale representation based on a centroid calculated from multiple data samples taken for each pixel during the scanning process.

Career Highlights

Eiiehi Ide is associated with Minolta Company, Ltd., where he has been able to apply his expertise in measurement technology. His work at Minolta has allowed him to develop innovative solutions that enhance the accuracy and efficiency of three-dimensional measurements.

Collaborations

Eiiehi Ide has collaborated with notable colleagues, including Hideki Tanabe and Toshio Norita. These collaborations have contributed to the advancement of measurement technologies and have fostered a creative environment for innovation.

Conclusion

Eiiehi Ide's contributions to three-dimensional measurement technology exemplify the impact of innovation in enhancing measurement accuracy. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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