The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2001
Filed:
Mar. 22, 1999
Toshio Norita, Osaka, JP;
Hiroshi Uchino, Otokuni-Gun, JP;
Hideki Tanabe, Ibaraki, JP;
Eiiehi Ide, Itami, JP;
Koichi Kamon, Takatsuki, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
A three-dimensional measurement apparatus includes an optical system for scanning a reference beam across a target object to be measured, a light sensor which receives light reflected from the target object, and a processor for calculating a three-dimensional shape of the target object from the received light. An image for calculating the three-dimensional shape of the target object and an image for displaying the target object are both captured by the same sensor. The displayed image is a grayscale image that is based on a centroid that is calculated from multiple data samples taken for each pixel in the image as the target is being scanned.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile