Efim Kerner

Title: Efim Kerner: Innovator in High Voltage Detection and Wafer Zapping Technologies

Introduction

Efim Kerner is a notable inventor based in Rehovot, Israel. He has made significant contributions to the fields of high voltage detection and wafer processing technologies. With a total of 5 patents to his name, Kerner's work has had a substantial impact on the industry.

Latest Patents

Kerner's latest patents include an arc detector and a method for detecting arcs. This innovative system comprises a first high voltage unit coupled via a high voltage supply cable to a second high voltage unit. It features a transformer configured to magnetically couple the high voltage supply cable to the windings of a transformer. Additionally, a detection unit monitors a windings signal developed in the windings of the transformer to detect arcs formed within both high voltage units. Another significant patent is a system and method for selective zapping. This system includes a pulse generator, a sensor, and two conductive interfaces. The pulse generator generates zapping pulses, while the sensor monitors the coupling between the interfaces to provide a monitoring result, allowing for precise control of the zapping process.

Career Highlights

Throughout his career, Efim Kerner has worked with prominent companies such as Applied Materials Israel Limited and Angiosonics Inc. His experience in these organizations has allowed him to develop and refine his innovative technologies.

Collaborations

Kerner has collaborated with notable colleagues, including Tuvia Biber and Efraim Siman Tov. These partnerships have contributed to the advancement of his projects and innovations.

Conclusion

Efim Kerner's contributions to high voltage detection and wafer zapping technologies demonstrate his expertise and innovative spirit. His patents reflect a commitment to advancing technology in these critical areas.