Edwin L Strickland, Iii

Title: Edwin L Strickland, III: Innovator in Computed Tomography and Container Analysis

Introduction

Edwin L Strickland, III is a notable inventor based in Austin, TX, recognized for his contributions to the fields of computed tomography and container analysis. With a total of 2 patents, Strickland has developed innovative methods that enhance the quality control applications of computed tomography systems.

Latest Patents

Strickland's latest patents include a "Method of calibration for computed tomography scanners utilized in quality control applications." This method involves calibrating a computed tomography system by using a scan geometry defining tool mounted on a rotating object positioning unit. The process includes directing a beam from an x-ray source through the tool and analyzing the detected image to determine the distance from the x-ray source to the center of rotation. Additionally, he has developed a "Process for analyzing the contents of containers," which involves obtaining images of a container in different positions and overlaying them to identify horizontal contents while erasing tilted objects from view.

Career Highlights

Throughout his career, Edwin L Strickland, III has worked with reputable companies such as Scientific Measurement Systems, Inc. and United Technologies Corporation. His experience in these organizations has contributed to his expertise in the development of advanced technologies in his field.

Collaborations

Strickland has collaborated with notable individuals, including John S Steude and Rodney H Warner, who have contributed to his innovative projects and research endeavors.

Conclusion

Edwin L Strickland, III stands out as a significant figure in the realm of innovation, particularly in computed tomography and container analysis. His patents reflect a commitment to advancing technology and improving quality control processes.