The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Aug. 28, 2008
Rodney H. Warner, Austin, TX (US);
Edwin L. Strickland, Iii, Austin, TX (US);
Henry W. Sikorski, East Granby, CT (US);
Rodney H. Warner, Austin, TX (US);
Edwin L. Strickland, III, Austin, TX (US);
Henry W. Sikorski, East Granby, CT (US);
United Technologies Corporation, Hartford, CT (US);
Abstract
A method of calibrating a computed tomography system includes the steps of mounting a scan geometry defining tool on a rotating object positioning unit of a computer tomography scanner. The scan geometry defining tool has structure of precisely measured dimensions. A beam is directed from an x-ray source of the computed tomography system through the structure of the scan geometry defining tool. A detected image after absorption of the x-ray from the scan geometry defining tool is analyzed, and utilized to determine a distance from the x-ray source spot location to the center of rotation of the object positioning unit. A beam is also directed from the x-ray source through a system performance test standard tool and analyzes a number of electronic and computer performance characteristics. The analyzed characteristics can be compared to expected characteristics to provide feedback on the operation of electronic and computer functions within the computed tomography system.