The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 1995
Filed:
May. 06, 1993
John S Steude, Cedar Park, TX (US);
Edwin L Strickland, III, Austin, TX (US);
Scientific Measurement Systems, Inc., Austin, TX (US);
Abstract
A process for analyzing the contents of containers comprising obtaining a first image of the container, tilting the container, obtaining a second image of the contents of the container in the tilted position, overlaying the first and second images, and subtracting one image from the other so that contents that remain horizontal are identified and objects that tilt are substantially erased from view in the final differenced image. In one method, the container is manually or mechanically moved relative to the image taking device, such as a digital radiography device. In another method, in order to avoid parallax problems, the container and image taking device are moved together. Computed tomography can be used in combination to obtain more characterization of the contents including shapes, densities, atomic numbers, wall thicknesses, and the like.