Neubiberg, Germany

Eckhard Leonhard Sperschneider

This inventor holds 3 USPTO granted patents. Top assignees: Macrotron Process Technologies Gmbh, Matrix Technologies Corporation. Active years: 2001-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Eckhard Leonhard Sperschneider. Retrieved from https://idiyas.com/inventor/eckhard-leonhard-sperschneider

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2001-2013

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3 patents (USPTO):Explore Patents

Title: Biography of Eckhard Leonhard Sperschneider

Introduction: Eckhard Leonhard Sperschneider is a notable inventor based in Neubiberg, Germany. He has made significant contributions to the field of X-ray testing methods and devices, particularly in the inspection of circuit boards.

Latest Patents: Sperschneider holds three patents, with his latest innovations focusing on advanced X-ray testing methods. One of his patents describes a method for capturing a first X-ray image of a circuit board equipped with components on one side and a second X-ray image of a board with components on both sides. This method enhances the evaluation of soldered joints by utilizing a computer unit to analyze pixel values from both images. Another patent outlines a process and apparatus for inspecting solder joints for defects using X-rays, where predetermined measurement parameters are established for reference points before inspection.

Career Highlights: Throughout his career, Sperschneider has worked with several companies, including Macrotron Process Technologies GmbH and Matrix Technologies Corporation. His expertise in X-ray technology has positioned him as a key figure in the development of inspection methods for electronic components.

Collaborations: Sperschneider has collaborated with notable colleagues such as Jan Rimbach and Martin Sokolowski. Their combined efforts have contributed to advancements in the field of X-ray testing and inspection.

Conclusion: Eckhard Leonhard Sperschneider's innovative work in X-ray

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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