This inventor holds 1 USPTO granted patent. Top assignee: Opnet Technologies, Inc.. Active years: 2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008
Title: Earl Charles LaBatt, Jr: Innovator in Performance Metric Collection
Introduction
Earl Charles LaBatt, Jr. is a notable inventor based in Litchfield, NH (US). He has made significant contributions to the field of performance metrics through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of monitoring systems.
Latest Patents
Earl Charles LaBatt, Jr. holds a patent for a system titled "Performance metric collection and automated analysis." This invention includes a metric monitoring and analysis system that features dynamic sampling agents located in monitored system elements and a service management platform. Each sampling agent is equipped with a data adapter that collects metric data in a common format, a threshold generator for determining dynamic metric threshold ranges, an alarm detector that generates an indicator when a metric deviates outside a dynamic threshold range or a static threshold, and a deviation tracker that generates alarm severity scores. The service platform includes an alarm analyzer that identifies root causes of system alarm conditions by correlating grouped metrics or conducting forensic analysis of temporally or statistically correlated secondary forensic data.
Career Highlights
Earl has made a mark in the technology sector through his work at Opnet Technologies, Inc. His innovative approach to performance metrics has positioned him as a key figure in the development of advanced monitoring systems.
Collaborations
Earl has collaborated with notable colleagues, including David Ronald White and John J McGee. Their combined expertise has contributed to the success of various projects within their field.
Conclusion
Earl Charles LaBatt, Jr. is a distinguished inventor whose work in performance metric collection and automated analysis has made a significant impact in technology. His contributions continue to influence the way systems are monitored and analyzed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
