The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 28, 2008
Filed:
Aug. 01, 2007
David Ronald White, Merrimack, NH (US);
John J. Mcgee, Christiansburg, VA (US);
Steven J. Baron, Nashua, NH (US);
Edward W. Macomber, Westford, MA (US);
Earl Charles Labatt, Jr., Litchfield, NH (US);
David Ronald White, Merrimack, NH (US);
John J. McGee, Christiansburg, VA (US);
Steven J. Baron, Nashua, NH (US);
Edward W. Macomber, Westford, MA (US);
Earl Charles LaBatt, Jr., Litchfield, NH (US);
Opnet Technologies, Inc., Bethesda, MD (US);
Abstract
A metric monitoring and analysis system including dynamic sampling agents located in monitored system elements and a service management platform. Each sampling agent includes a data adapter collecting metric data in a common format, a threshold generator for determining dynamic metric threshold ranges, an alarm detector generating an indicator when a metric deviates outside a dynamic threshold range or a static threshold, and a deviation tracker generating an alarm severity scores. The service platform includes an alarm analyzer identifying root causes of system alarm conditions by correlation of grouped metrics or forensic analysis of temporally or statistically correlated secondary forensic data or data items from a service model of the system.