Waltham, MA, United States of America

E Robert Schildkraut


Average Co-Inventor Count = 3.0

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2011-2015

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3 patents (USPTO):Explore Patents

Title: E Robert Schildkraut: Innovator in MEMS Technology

Introduction

E Robert Schildkraut is a notable inventor based in Waltham, MA (US), recognized for his contributions to Micro-Electro-Mechanical Systems (MEMS) technology. He holds a total of three patents, showcasing his innovative approach to engineering and design.

Latest Patents

Schildkraut's latest patents include a MEMS Michelson interferometer featuring a reciprocating platform with a moving mirror and a method of fabrication. This interferometer system comprises an optical bench and at least two mirror structures, which are patterned from one or more layers on the optical bench. These structures extend substantially perpendicularly to the bench, defining two interferometer arms that provide a MEMS interferometer. Additionally, this MEMS interferometer is implemented in a Fourier transform spectrometer, which includes a common housing containing the interferometer and a gas cell, possibly with a preconcentrator. Another significant patent is for a miniature Fourier transform spectrometer and its method of operation, which also utilizes a MEMS interferometer within a similar framework.

Career Highlights

E Robert Schildkraut is currently associated with Block Engineering, LLC, where he continues to develop innovative technologies in the field of MEMS. His work has significantly advanced the capabilities of spectrometric analysis and measurement.

Collaborations

Schildkraut has collaborated with notable colleagues, including David Reyes and Jinhong Kim, contributing to the advancement of MEMS technology and its applications.

Conclusion

E Robert Schildkraut's work in MEMS technology and his innovative patents have made a significant impact in the field of engineering. His contributions continue to influence the development of advanced spectrometric systems.

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