The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Dec. 28, 2007
Applicants:

David Reyes, Boston, MA (US);

E. Robert Schildkraut, Waltham, MA (US);

Jinhong Kim, Brookline, MA (US);

Inventors:

David Reyes, Boston, MA (US);

E. Robert Schildkraut, Waltham, MA (US);

Jinhong Kim, Brookline, MA (US);

Assignee:

Block Engineering, LLC, Marlborough, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

A Micro-Electro-Mechanical Systems (MEMS) interferometer is implemented in a Fourier transform spectrometer, which includes a common housing containing the interferometer and a gas cell, possibly including a preconcentrator. The interferometer system includes an optical bench and at least two mirror structures, being patterned from one or more layers on the optical bench and erected to extend substantially perpendicularly to the bench to define two interferometer arms to provide a MEMS interferometer.


Find Patent Forward Citations

Loading…