Richardson, TX, United States of America

Dwight Jaynes


Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 1998-2003

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3 patents (USPTO):Explore Patents

Title: The Innovations of Dwight Jaynes

Introduction

Dwight Jaynes is a notable inventor based in Richardson, Texas. He has made significant contributions to the field of integrated circuit testing, holding a total of three patents. His work primarily focuses on enhancing the functionality and efficiency of test circuits.

Latest Patents

One of Dwight's latest patents is the "Multipurpose Test Chip Input/Output Circuit." This innovative system is designed for testing integrated circuits and includes a variety of simultaneous switching output (SSO) cells. Each SSO cell features an output driver that provides an output signal to a respective signal pin coupled to the integrated circuit. The system incorporates a toggle circuit that toggles its output and a multiplexer that selects a signal for communication to the output driver. This allows for precise control over the output provided to the respective signal pin. Another significant patent is also titled "Multipurpose Test Chip Input/Output Circuit." This circuit can create either a simultaneously switching outputs (SSO) event or a simultaneously switching inputs (SSI) event. It utilizes a toggle register to generate a toggling signal and includes signal lines connected to external pins for effective operation.

Career Highlights

Dwight Jaynes has built a successful career at Hewlett-Packard Company, where he has been instrumental in developing advanced testing technologies. His expertise in integrated circuits has positioned him as a valuable asset within the company.

Collaborations

Throughout his career, Dwight has collaborated with talented individuals such as Harold Wallace Dozier and Michael D Bienek. These partnerships have contributed to the successful development of his innovative patents.

Conclusion

Dwight Jaynes is a distinguished inventor whose work in integrated circuit testing has led to significant advancements in the field. His patents reflect his commitment to innovation and excellence in technology.

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