San Jose, CA, United States of America

Duc Huu Nguyen

This inventor holds 1 USPTO granted patent. Top assignee: National Semiconductor Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Duc Huu Nguyen. Retrieved from https://idiyas.com/inventor/duc-huu-nguyen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Duc Huu Nguyen: Innovator in Semiconductor Testing

Introduction

Duc Huu Nguyen is a notable inventor based in San Jose, California. He has made significant contributions to the field of semiconductor testing, particularly through his innovative patent that enhances the efficiency of voltage contrast testing.

Latest Patents

Duc Huu Nguyen holds a patent titled "Method of reducing the time required to perform a passive voltage contrast test." This invention focuses on digitizing a passive voltage contrast image to create contrast data that represents the image. By comparing this contrast data to computer-aided design (CAD) data that defines the semiconductor device, the time required for testing is substantially reduced. He has 1 patent to his name.

Career Highlights

Duc Huu Nguyen is currently employed at National Semiconductor Corporation, where he applies his expertise in semiconductor technology. His work has been instrumental in advancing testing methodologies within the industry.

Collaborations

Duc has collaborated with talented coworkers, including Zachary Joshua Gemmill and Usharani Bhimavarapu, contributing to a dynamic work environment that fosters innovation.

Conclusion

Duc Huu Nguyen's contributions to semiconductor testing through his patent demonstrate his commitment to innovation and efficiency in the field. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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