The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2010

Filed:

Sep. 26, 2005
Applicants:

Steven Jacobson, Dublin, CA (US);

Duc Huu Nguyen, San Jose, CA (US);

William NG, San Jose, CA (US);

Zachary Joshua Gemmill, Mountain View, CA (US);

Usharani Bhimavarapu, San Jose, CA (US);

Kevin Weaver, San Jose, CA (US);

Inventors:

Steven Jacobson, Dublin, CA (US);

Duc Huu Nguyen, San Jose, CA (US);

William Ng, San Jose, CA (US);

Zachary Joshua Gemmill, Mountain View, CA (US);

Usharani Bhimavarapu, San Jose, CA (US);

Kevin Weaver, San Jose, CA (US);

Assignee:

National Semiconductor Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The time required to perform a passive voltage contrast test of an area of interest of a layer of interest is substantially reduced by digitizing a passive voltage contrast image to form contrast data that represents the image, and comparing the contrast data to computer aided design (CAD) data that defines the semiconductor device.


Find Patent Forward Citations

Jacobson, Steven. (2010). Method of reducing the time required to perform a passive voltage contrast test (U.S. Patent No. 7848562). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7848562

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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