This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Du-Sik Yoo: Innovator in Test Data Generation
Introduction
Du-Sik Yoo is a prominent inventor based in Hwaseong-si, South Korea. He has made significant contributions to the field of test data generation, showcasing his expertise through innovative solutions.
Latest Patents
Du-Sik Yoo holds a patent for a "Test data generator, test system and method thereof." This invention provides a method for receiving parallel test data at a first data rate and converting it into serial test data at a second data rate. The method allows for the selective insertion of noise, such as jitter noise and level noise, into the converted serial test data. This capability enables devices to be tested with higher data-rate test data, enhancing the efficiency and effectiveness of testing processes.
Career Highlights
Du-Sik Yoo is associated with Samsung Electronics Co., Ltd., a leading global technology company. His work at Samsung has allowed him to develop and refine his innovative ideas, contributing to advancements in technology and testing methodologies.
Collaborations
Some of his notable coworkers include Jin-Mo Jang and Young-bu Kim, who have collaborated with him on various projects within the company.
Conclusion
Du-Sik Yoo's contributions to test data generation exemplify the impact of innovation in technology. His patent and work at Samsung Electronics Co., Ltd. highlight his role as a key inventor in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile