The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2009
Filed:
Aug. 23, 2006
Jin-mo Jang, Suwon-si, KR;
Young-bu Kim, Seongnam-si, KR;
Du-sik Yoo, Hwaseong-si, KR;
Byung-wook Ahn, Hwaseong-si, KR;
Jin-Mo Jang, Suwon-si, KR;
Young-Bu Kim, Seongnam-si, KR;
Du-Sik Yoo, Hwaseong-si, KR;
Byung-Wook Ahn, Hwaseong-si, KR;
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Abstract
A test data generator, test system and method thereof are provided. In the example method, parallel test data may be received at a first data rate. The received parallel test data may be converted into serial test data at a second data rate. Noise (e.g., jitter noise, level noise, etc.) may be selectively inserted into the converted serial test data. The noise inserted into the serial test data, which may be configured to operate at a higher data rate than the parallel test data, may allow a device to be tested with higher data-rate test data. The example method may be performed by the example test data generator and/or by the example test system.