This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: Byung-Wook Ahn: Innovator in Test Data Generation
Introduction
Byung-Wook Ahn is a notable inventor based in Hwaseong, South Korea. He has made significant contributions to the field of test data generation, particularly through his innovative patent. His work is instrumental in enhancing the efficiency and effectiveness of testing systems.
Latest Patents
Byung-Wook Ahn holds a patent for a "Test data generator, test system and method thereof." This invention provides a method for receiving parallel test data at a first data rate and converting it into serial test data at a second data rate. The method allows for the selective insertion of noise, such as jitter noise and level noise, into the converted serial test data. This capability enables devices to be tested with higher data-rate test data, thereby improving the testing process.
Career Highlights
Ahn is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate and contribute to advancements in technology. His work at Samsung has positioned him as a key player in the development of testing systems that are crucial for modern electronic devices.
Collaborations
Some of his notable coworkers include Du-Sik Yoo and Jin-Mo Jang, who collaborate with him on various projects within the company.
Conclusion
Byung-Wook Ahn's contributions to test data generation exemplify the importance of innovation in technology. His patent reflects a significant advancement in testing methodologies, showcasing his role as a leading inventor in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile