Douglas Ray Hendricks

Title: Douglas Ray Hendricks: Innovator in Semiconductor Testing

Introduction

Douglas Ray Hendricks is a notable inventor based in San Jose, California. He has made significant contributions to the field of semiconductor testing, particularly through his innovative patent related to voltage contrast test structures. His work is essential for enhancing the efficiency and accuracy of integrated-circuit fabrication processes.

Latest Patents

Hendricks holds a patent for a method that involves electrically testing a semiconductor wafer during the integrated-circuit fabrication process. This method includes the use of a scanning charged-particle microscope (SCPM) to scan a surface within a defined scanning window. The patent outlines a detailed process that includes providing test structures on the wafer, which consist of conductive areas within a non-conductive background. This innovative approach allows for precise electrical state assessments of the test structures.

Career Highlights

Douglas Ray Hendricks is currently employed at Applied Materials Israel Limited, where he continues to advance semiconductor technology. His expertise in the field has positioned him as a valuable asset to his company and the industry at large.

Collaborations

Hendricks collaborates with various professionals in his field, including his coworker Ariel Ben-Porath. Their combined efforts contribute to the ongoing development of innovative solutions in semiconductor testing.

Conclusion

Douglas Ray Hendricks exemplifies the spirit of innovation in the semiconductor industry. His contributions through patents and collaboration with peers continue to shape the future of integrated-circuit fabrication.