This inventor holds 5 USPTO granted patents. Top assignee: Intel Corporation. Active years: 1991-2004.
Company Filing History:
Years Active: 1991-2004
Title: Douglas A. Guddat: Innovator in Memory Testing Technologies
Introduction
Douglas A. Guddat is a prominent inventor based in Portland, OR (US). He has made significant contributions to the field of memory testing technologies, holding a total of 5 patents. His work primarily focuses on improving the reliability and efficiency of SRAM devices.
Latest Patents
One of Guddat's latest patents is the "Programmable Weak Write Test Mode." This innovative circuit allows for SRAM weak write testing at multiple stress strength settings, which helps track process variation. Traditional weak write test circuitry often tests SRAM devices at a fixed stress strength, which can lead to inaccurate results due to environmental changes. Guddat's design incorporates multiple settings to account for uncertainties, ensuring more accurate testing outcomes.
Another notable patent is the "Low Yield Analysis of Embedded Memory." This invention involves a processor with an embedded memory array and low yield analysis circuitry. The circuitry provides a connection between the embedded memory array and I/O connectors, facilitating better analysis of memory cell performance and yield.
Career Highlights
Douglas A. Guddat is currently employed at Intel Corporation, where he continues to develop cutting-edge technologies in memory testing. His work has been instrumental in advancing the reliability of embedded memory systems.
Collaborations
Throughout his career, Guddat has collaborated with notable colleagues, including Glenn F. King and Tim Lambert. These partnerships have contributed to the successful development of innovative memory testing solutions.
Conclusion
Douglas A. Guddat's contributions to memory testing technologies have significantly impacted the field. His innovative patents reflect his commitment to enhancing the reliability of SRAM devices and embedded memory systems.