This inventor holds 2 USPTO granted patents. Top assignees: Dow Corning Corporation, Hemlock Semiconductor Corporation. Active years: 2009-2016.
Company Filing History:
Years Active: 2009-2016
Title: Doug Kreszowski: Innovator in Semiconductor Analysis
Introduction
Doug Kreszowski is a notable inventor based in Saginaw, MI (US). He has made significant contributions to the field of semiconductor materials, holding 2 patents that focus on advanced methods for analyzing impurities in silicon.
Latest Patents
Kreszowski's latest patents include innovative techniques for measuring bulk impurities in semiconductor materials. One of his patents describes a system that utilizes edge-on photoluminescence to identify and quantify impurities in semiconductor samples. This method involves a defocused collimated laser beam illuminating a sample surface, with a collection lens capturing photoluminescence from the sample edge. The orientation of the sample surface is crucial, as it can range from about 0° to 90° relative to the collection lens.
Another significant patent outlines a method for analyzing carbon concentration in crystalline silicon. This method involves providing a section from a zoned and annealed silicon core, which is extracted from a polycrystalline silicon composition. The core has a columnar shape and includes both a single crystalline silicon region and a freeze-out melt region. By analyzing the freeze-out melt region, Kreszowski's method allows for the determination of carbon concentration with a sensitivity of less than or equal to 10 parts per billion atomic.
Career Highlights
Throughout his career, Doug Kreszowski has worked with prominent companies such as Dow Corning Corporation and Hemlock Semiconductor Corporation. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.
Collaborations
Kreszowski has collaborated with various professionals in his field, including his coworker John W Hadd. These collaborations have likely enhanced his research and development efforts in semiconductor analysis.
Conclusion
Doug Kreszowski is a distinguished inventor whose work in semiconductor analysis has led to valuable patents and advancements in the field. His innovative methods for measuring impurities and analyzing carbon concentration in silicon are significant contributions to technology.