The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 16, 2016

Filed:

Jun. 03, 2011
Applicants:

Doug Kreszowski, Saginaw, MI (US);

John W. Hadd, Saginaw, MI (US);

Inventors:

Doug Kreszowski, Saginaw, MI (US);

John W. Hadd, Saginaw, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/89 (2006.01); G01N 21/95 (2006.01); G01N 21/64 (2006.01); G01N 21/94 (2006.01); G01J 3/443 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9505 (2013.01); G01J 3/443 (2013.01); G01N 21/6489 (2013.01); G01N 21/94 (2013.01); G01N 21/9501 (2013.01); G01N 21/9503 (2013.01);
Abstract

Provided are photoluminescence spectroscopy systems and methods for identifying and quantifying impurities in a semiconductor sample. In some embodiments, the systems and methods comprise a defocused collimated laser beam illuminating a first sample surface, and collection by a collection lens of photoluminescence from a sample edge at the intersection of the first surface with a substantially orthogonal second surface, wherein the first sample surface is oriented from about 0° to 90° with respect to a position parallel to the collection lens.


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