This inventor holds 1 USPTO granted patent. Top assignee: National Institute of Metrology, China. Active years: 2024.
Company Filing History:
Years Active: 2024
Title: Innovations of Dongxue Dai in Precision Measurement
Introduction
Dongxue Dai is a prominent inventor based in Beijing, China. He has made significant contributions to the field of precision measurement and metrology. His innovative work has led to the development of a unique method that enhances the accuracy of impedance measurements.
Latest Patents
Dongxue Dai holds a patent for a method titled "Method for achieving terminal-pair definition of four-terminal-pair impedance and application thereof." This invention provides a novel approach to defining terminal pairs in four-terminal-pair (4TP) impedance. The method involves connecting a current output terminal of a two-stage follower to a high current terminal of impedance through a coaxial line. Additionally, it connects a voltage output terminal of the two-stage follower to a high voltage terminal of the impedance, ensuring that the current of the high voltage terminal is zero. This innovative design allows for equal and reverse currents in the core wire and outer wire of the high current terminal. The invention significantly improves the balancing speed of the 4TP impedance bridge, enabling accurate and fast comparative measurements with high precision.
Career Highlights
Dongxue Dai is affiliated with the National Institute of Metrology, China, where he continues to advance research in precision measurement. His work has been instrumental in enhancing the methodologies used in metrology, particularly in the area of impedance measurement.
Collaborations
Dongxue Dai has collaborated with notable colleagues, including Yan Yang and Lu Huang. Their combined expertise has contributed to the success of various projects within the field of metrology.
Conclusion
Dongxue Dai's innovative contributions to precision measurement and metrology exemplify the importance of research and development in advancing technology. His patent reflects a significant step forward in achieving high precision in impedance measurements.