Poughkeepsie, NY, United States of America

Donguk Choi

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donguk Choi. Retrieved from https://idiyas.com/inventor/donguk-choi-mj3y0l0e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovations of Donguk Choi

Introduction

Donguk Choi is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of semiconductor processing. His work focuses on enhancing the efficiency and accuracy of lithography processes.

Latest Patents

Donguk Choi holds a patent for the invention titled "Automatic detection of mask defects in semiconductor processing." This innovative technology involves scanning a wafer during the lithography process. It compares a first chip with a neighboring chip to detect defects. When a defect is identified, the location is stored for further analysis. The system then selects a second chip closest to the center of the wafer for additional scanning. Inspection data from this second chip is compared with mask pattern data to ensure the lithography process can continue without issues.

Career Highlights

Donguk Choi is associated with International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to work on cutting-edge technologies that drive advancements in semiconductor manufacturing.

Collaborations

Due to space constraints, the details of collaborations will not be included.

Conclusion

Donguk Choi's contributions to semiconductor processing through his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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