Company Filing History:
Years Active: 2004
Title: Innovations of Dongsheng Don Chen
Introduction
Dongsheng Don Chen is an accomplished inventor based in Union City, CA (US). He has made significant contributions to the field of optical inspection technology. His work primarily focuses on methods and apparatus for detecting anomalies in samples, particularly in semiconductor wafers.
Latest Patents
Dongsheng Don Chen holds a patent for an "Apparatus and methods for optically inspecting a sample for anomalies." This patent discloses methods and apparatus for detecting a wide dynamic range of intensity values from a beam originating from a sample. The inspection system provides detected output signals that can be analyzed to determine the presence of defects. For instance, intensity values from a target die are compared to those from a reference die, where significant differences may indicate defects. The system includes a beam generator and a detector that generates a non-linear detected signal, which is then digitized for analysis.
Career Highlights
Dongsheng Don Chen is associated with Kla-Tencor Technologies Corporation, a company known for its advanced semiconductor inspection and metrology solutions. His innovative work has contributed to the company's reputation in the industry.
Collaborations
Some of his notable coworkers include Ralph C. Wolf and Eva L. Benitez, who have collaborated with him on various projects within the company.
Conclusion
Dongsheng Don Chen's contributions to optical inspection technology have paved the way for advancements in semiconductor manufacturing. His innovative patent reflects his expertise and commitment to improving inspection methods.