Jinju-si, South Korea

Donghyeon Jang


Average Co-Inventor Count = 4.2

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2022-2024

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5 patents (USPTO):Explore Patents

Title: Innovations of Donghyeon Jang in Digital X-Ray Technology

Introduction

Donghyeon Jang is a prominent inventor based in Jinju-si, South Korea. He has made significant contributions to the field of digital X-ray technology, holding a total of five patents. His work focuses on enhancing the efficiency and effectiveness of digital X-ray detectors.

Latest Patents

Among his latest patents is an innovative array substrate for digital X-ray detectors. This technology includes a design where the width of a data line or a gate line extending across a dummy pixel area is smaller than that of the active area. This design ensures that static electricity generated during the manufacturing process does not flow into the active area, but rather into the dummy pixel area, minimizing line defects and block luminance deviation defects. Another notable patent involves a method for manufacturing a digital X-ray detector, where the lower electrode of a PIN diode and a second protective layer are formed using the same mask process. This approach reduces the number of mask processes, thereby increasing process efficiency and reducing defects caused by foreign materials.

Career Highlights

Donghyeon Jang is currently employed at LG Display Co., Ltd., where he continues to innovate in the field of display technology. His work has been instrumental in advancing the capabilities of digital X-ray detectors, making them more reliable and efficient.

Collaborations

He has collaborated with notable coworkers, including JaeHo Yoon and MoonSoo Kang, contributing to the development of cutting-edge technologies in their field.

Conclusion

Donghyeon Jang's contributions to digital X-ray technology exemplify the impact of innovative thinking in the medical imaging industry. His patents reflect a commitment to improving manufacturing processes and enhancing the performance of digital X-ray detectors.

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