Houston, TX, United States of America

Donald W Chiu

USPTO Granted Patents = 3 

Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 35(Granted Patents)


Location History:

  • Houston, TX (US) (1995 - 1997)
  • Santa Clara, CA (US) (2013)

Company Filing History:


Years Active: 1995-2013

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3 patents (USPTO):Explore Patents

Title: The Innovations of Donald W. Chiu

Introduction

Donald W. Chiu is an accomplished inventor based in Houston, TX. He has made significant contributions to the field of electronics testing, holding a total of 3 patents. His work focuses on enhancing the efficiency and reliability of testing devices under various conditions.

Latest Patents

One of Chiu's latest patents is titled "Test electronics to device under test interfaces, and methods and apparatus using same." This invention features a test system equipped with a set of test electronics designed for testing a device under test (DUT). The system includes at least one test electronics to DUT interface that utilizes a zero insertion force (ZIF) connector. This innovative design incorporates a clamping mechanism that applies orthogonal forces to ensure a secure connection between the probe card and the DUT.

Another notable patent is the "Trailer hitch box beam cover with integral trailer wiring connector." This protective cover is designed to safeguard a trailer hitch ball or box beam. It features a resilient body with an integrally formed wiring connector, minimizing moisture, dirt, and physical damage to the trailer hitch ball.

Career Highlights

Throughout his career, Donald W. Chiu has worked with various companies, including Advantest (Singapore) Pte Ltd. His experience in the industry has allowed him to develop innovative solutions that address real-world challenges in electronics testing.

Collaborations

Chiu has collaborated with notable professionals in his field, including Sanjeev Grover and John William Andberg. These partnerships have contributed to the advancement of his inventions and the overall progress in electronics testing technology.

Conclusion

Donald W. Chiu's contributions to the field of electronics testing are noteworthy. His innovative patents reflect his commitment to improving testing methodologies and protecting essential components. His work continues to influence the industry and inspire future innovations.

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