Other

Advantest (singapore) Pte Ltd

Donald W Chiu

John William Andberg

Sanjeev Grover

In one embodiment, a test system has a set of test electronics for testing a device under test (DUT). The test system also has at least one test electronics to DUT interface having a zero insertion force (ZIF) connector. Each ZIF connector has a ZIF connector to DUT clamping mechanism configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the ZIF connector against the probe card, and simultaneously ii) exert at least one second orthogonal force on the probe card, the at least one second orthogonal force being opposite in direction to the first orthogonal force.

Test electronics to device under test interfaces, and methods and apparatus using same

An cover for protecting a trailer hitch ball or box beam comprises a resilient body having a wiring connector integrally formed therewith. Moisture, dirt and physical damage of the trailer hitch ball is minimized through use of the protective cover.

Trailer hitch box beam cover with integral trailer wiring connector

An cover for protecting a trailer hitch ball or box beam comprises a resilient body having a wiring connector and wiring cable integrally formed therewith. Moisture, dirt and physical damage of the trailer hitch ball is minimized through use of the protective cover.

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Houston, TX, United States of America

Donald W Chiu