Company Filing History:
Years Active: 2015-2022
Title: The Innovations of Donald S. Gibson
Introduction
Donald S. Gibson is a notable inventor based in West Henrietta, NY, with a remarkable portfolio of eight patents. His work primarily focuses on advanced measurement techniques for multilayer structures, showcasing his expertise in optical technologies.
Latest Patents
One of Gibson's latest patents is an apparatus and method for the measurement of multilayer structures. This innovative method identifies the material and determines the physical thickness of each layer in a multilayer structure. It involves measuring the optical thickness of each layer as a function of the wavelength of a light source. The process calculates a normalized group index of refraction dispersion curve for each layer, which is then compared to a reference database of known materials to identify the material of each layer. The physical thickness of each layer is determined from the group index of refraction dispersion curve and the measured optical thickness data. This patent also includes a method for determining the group index of refraction dispersion curve of a known material, along with an apparatus for performing these methods.
Career Highlights
Throughout his career, Donald S. Gibson has contributed significantly to the field of optical measurement. He has worked with companies such as Lumetrics, Inc. and Lumentrics, Inc., where he applied his innovative techniques to real-world applications. His patents reflect a deep understanding of multilayer structures and their measurement, positioning him as a leader in this niche area of technology.
Collaborations
Gibson has collaborated with notable professionals in his field, including Filipp V. Ignatovich and Michael Alan Marcus. These collaborations have likely enriched his work and contributed to the development of his innovative patents.
Conclusion
Donald S. Gibson's contributions to the field of optical measurement through his patents and collaborations highlight his significant role as an inventor. His innovative methods for measuring multilayer structures continue to influence advancements in technology.