Ladue, MO, United States of America

Donald M Jacobsen

This inventor holds 1 USPTO granted patent. Top assignee: The Measuregraph Company. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Donald M Jacobsen. Retrieved from https://idiyas.com/inventor/donald-m-jacobsen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: The Innovations of Donald M. Jacobsen

Introduction

Donald M. Jacobsen is a notable inventor based in Ladue, MO (US). He has made significant contributions to the field of measurement technology. His innovative spirit is exemplified through his patent, which showcases his expertise and creativity.

Latest Patents

Jacobsen holds a patent for a "Combined fabric measuring and cost computing device." This invention reflects his commitment to improving efficiency in fabric measurement and cost analysis. With 1 patent to his name, he has made a mark in the industry.

Career Highlights

Jacobsen is associated with The Measuregraph Company, where he applies his skills and knowledge to advance measurement technologies. His work at the company has been instrumental in developing solutions that cater to the needs of the fabric industry.

Collaborations

Throughout his career, Jacobsen has collaborated with talented individuals such as Tadmor Shalon and Walter A. Thater. These partnerships have fostered innovation and contributed to the success of his projects.

Conclusion

Donald M. Jacobsen's contributions to the field of measurement technology are noteworthy. His patent and work at The Measuregraph Company highlight his dedication to innovation. His collaborations further enhance his impact in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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