Forward Citations = 40

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6 inventors (with patents filed for the assignee):

Gail B Schwarz (3 out of 3 patents)

Tadmor Shalon (2 out of 3 patents)

John A Newell (1 out of 1 patent)

4. Walter A Thater (1 out of 1 patent)

5. Steve Somogye, Jr (1 out of 1 patent)

6. Donald M Jacobsen (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. D277462 - Combined fabric measuring and cost computing device (1985-02-05),

2. 4394740 - Computer adapted apparatus and method for pricing lengths of material (1983-07-19),

3. 4144575 - Apparatus for dispensing fabric from a bolt (1979-03-13),

4. 4084467 - Apparatus for dispensing fabric from a bolt (1978-04-18),

5. 4039805 - Apparatus for calculating the price of measured lengths of material (1977-08-02),

6. 4004748 - Apparatus for dispensing fabric from a bolt (1977-01-25),

Company Overview

The Measuregraph Company is a leading provider of measurement solutions for industries such as textiles, apparel, and furniture. With a focus on innovation and precision, we offer cutting-edge technology and software to help businesses optimize their production processes and improve quality control. Our products include automated pattern digitizers, fabric inspection systems, and 3D body scanning devices. Trust Measuregraph for accurate and reliable measurement solutions.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#269 in St. Louis, MO

#645 in Missouri

#45,007 in US

St. Louis, MO, United States of America

The Measuregraph Company

Forward Citations = 40

6 inventors:

Gail B Schwarz (3 out of 3 patents)

Tadmor Shalon (2 out of 3 patents)

John A Newell (1 out of 1 patent)

4. Walter A Thater (1 out of 1 patent)

5. Steve Somogye, Jr (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: The Measuregraph Company. Retrieved from https://idiyas.com/company/measuregraph-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]